Analytical, FA/DA Lab

SEM, FIB, TEM, EDS, XRF, AFM/MFM

Hitachi S3000 SEM/EDS
Hitachi S4700 SEM Measurement
SEM S4700, 1um Gold encapsulated NiFe particles
SEM S4700 Curved Fins of an Ion Spectrometer
SEM S4700 SEM Bug
Focused Ion Beam (FIB) Pictures of various FIB Milling of Thin Film Structures